System Level Test (SLT) is testing a device under test (DUT) in an environment that closely matches its final use. The growing complexity of SOCs and SIPs, combined with increasingly stringent quality requirements, has led to wider adoption of SLT as a key advantage in device test strategies.
By using SLT to functionally test a device that matches its final use environment, device manufacturers can prevent fault escapes that might not have been detected with traditional wafer and package test techniques. Teradyne has responded to industry trends to enable testing of various Radio Frequency (RF) functionalities by developing the industry’s first RF-enabled high-volume SLT tester, Titan-RF. RF testing in SLT is a highly desired trend but hard to realize due to the complexity and scalability of RF solutions.