Data-driven applications propel evolution in automated test equipment
Unprecedented growth in data-intensive applications continues to reshape the global semiconductor landscape. Meeting this ever-increasing demand for data calls for a robust technology ecosystem – integrating sensors and systems for data capture, networks for transmission, and advanced processing and storage solutions for analysis.
The successful deployment of these cutting-edge applications depends on the creation of highly complex semiconductor technologies. Ensuring their quality and reliability demands test strategies that prioritize efficiency and precision. By leveraging automated test equipment (ATE) and system-level testing (SLT), the industry is better equipped to meet the demands of AI and high-performance computing (HPC) applications, spanning both data center environments and edge devices.
Jeorge Hurtate’s latest article in Semiconductor Engineering takes a deeper look, exploring how ATE innovation enables semiconductor manufacturers to keep pace with rapid advancements in chip performance and the increasing complexity of modern semiconductor devices. With a smart, flexible approach to test, the industry can ensure the quality, reliability, and performance of the next generation of semiconductor technologies.
Read the full article, Semiconductor Test Faces Technology Shifts in the AI Era, published by Semiconductor Engineering.
Dr. Jeorge S. Hurtarte is currently Senior Director of Product Marketing in the Semiconductor Test group at Teradyne. Jeorge has held various technical, management and executive positions at Teradyne, Lam Research, LitePoint, TranSwitch, and Rockwell Semiconductors. He is a voting member of the IEEE 802.11 Wi-Fi standards committee and serves as the secretary of the IEEE 802.11ay task group. Jeorge is currently the co-chair of the IEEE Heterogeneous Integration Roadmap (HIR) Test Working Group, and a visiting professor at the University of California, Santa Cruz and the University of Phoenix.