With the introduction of towerless UltraFLEXplus, the test cell footprint or floor space has been largely consumed by universal manipulators to manage larger and heavier testers. Semiconductor manufacturers are requesting more test capability in smaller footprints to avoid building new test facilities. UltraFLEXplus meets these reduced footprint needs while maintaining existing towerless signal delivery, rigid architectures, docking interfaces and maintains the existing DIB frame architecture for smooth transition with existing products. Hinge manipulator features on UltraFLEXplus does not stop there. Added benefits also include a host of new improvements such as: better docking repeatability, integrated probecard security, and automated OPD docking operation for fully automated (hands-off) testing capability. This paper will introduce a new probecard orientation and prober loading for hinge test cells. Also included are details of feature enhancements which not only add value to the Customer for future test floor operations and planning, but simplify cable and hose management, less test cell setup complexity, and overall stability over time. The significant benefit of reduced footprint with the UltraFLEXplus Q24 that doubles the instrument quantity or signal capability with no impact to the test cell footprint as compared to the smallest tester in the UltraFLEXplus family. Hinge manipulators are available with all major prober suppliers with no need to change existing prober Supplier.