Standard Features

Standard features available with all TestStation Models include:

  • High-performance Windows-based PC Controller with MXI interface for fast communication with tester instrument bus and maximum test throughput
  • Impedence Measurement unit with built-in Linear and Binary detection algorithms that quickly and accurately diagnoses short and open defects between PCB nets
  • Analog subsystem capable of performing precision measurements of Analog components (Resistors, Capacitors, Inductors, Diodes, Transistors, FET's, Opamps, Rectifiers)
  • High Voltage source and measurement instruments capable of sourcing 120V and measuring up to 200V
  • Arbitrary Waveform Generator capable of sourcing sine, square, triangle, or complex user-defined waveforms
  • Digital Voltmeter/Digitizer instrument that can be configured as a sampling scope to capture on board signals
  • Junction Xpress vectorless test technique which can detect open device pins and marginal solder joints on digital ICs by apply AC signals and measuring harmonic frequencies at diode junctions
  • Instrument multiplexer and high-performance pin scanner matrix that allows any instrument or tester pin to be routed to any one of eight measurement channels
  • Nine external ports for connecting and operating IEEE-488/GPIB compatible instruments
  • Synchronized Analog & Digital subsystems for performing coherent measurements of mixed-signal devices
  • Built-in calibration standards module and self-test circuits
  • Dedicated, user-programmable, relay drivers
  • High-level programming language that allows programmers to directly access and control all tester instrumentation and test sequences
  • TestStation Debug Pro and Production Pro software environments with built-in productivity tools for accelerating program debug and maximizing production efficiency
  • AutoFLASH and ISP Toolset supports automatic generation of test vector models for Programmable Logic Devices
  • Powerful Data Collection and Data Display software


Optional features for TestStation systems:

  • Design-to-Build (D2B) software framework simplifies CAD preparation activities, program preparation, and fixture assembly
  • TestStation Development Pro software environment enables fast development of TestStation in-circuit test programs using automatic test generators and comprehensive device test libraries
  • User power supplies, both fixed and programmable, are available for powering up the board under test; supplies can be configured in series or parallel to obtain voltages up to 300V or currents up to 28A
  • System Frequency/Time Measurement (SFTM) provides the ability to make numerous time-related measurements (frequency, period, time interval, ratio, count, duty cycle and pulse width) on the board under test
  • Framescan FX Vectorless Test software and hardware for detecting open pins on devices and connectors using an upowered capacitive measurement technique
  • High performance UltraPin II Digital Driver and Sensors with 15mV test accuracy, per pin programmable logic voltages, automatic driver verification, backdrive monitoring and control, dual logic thresholds, bi-directional pin drivers and programmable slew rates
  • Specialized digital timing controls precision application of digital vectors and supports data compression techniques such as timing sets, nested loops, subroutines, data tables, data import & export, and CRC checking
  • Independent Clock Drive, Clock Sense, and Trigger (CST) signal pins can operate at speeds up to 20MHz and are synchronized with the D/S pins to simplify the development of test vectors for Flash, ISP, boundary scan, and complex digital components
  • BasicSCAN boundary scan test model generation software automatically generates digital device vector test models for the individual boundary scan boards with limited test access
  • Scan Pathfinder boundary scan test generation and diagnostic software automatically generates comprehensive tests to detect faults on boundary scan boards with limited test access
  • Powered Framescan combines the vectorless test capabilities of framescan with the built-in control capabilities of boundary scan to detect opens on connector and device pins that do not have physical test access
  • Deep Serial Memory is a digital instrument that can be used to extend the memory behind the digital pins from 64K up to 1Gig and is useful in test applications like PLD programming and boundary scan that may require very long streams of data
  • The Multi-Function Application Board allows interfacing application specific hardware required by the manufacturer directly into the test system and provides a high frequency scanner module for connecting the custom circuitry to the board under test
  • PXI Functional Expansion Board plugs into the tester backplane and supports adding four compact PXI instruments which can be used to expand the functional test capabilities of the tester
  • Dynamic Programming Extension software allows external software applications to communicate back and forth with the TestStation runtime controller using standard DLL communication standards