With the development of consumer electronics, a variety of different charging protocols have emerged, and protocol chips also play an important role in this application. Even in the charging field of automotive electronics, the application of protocol chips is more and more important. On the other side, to minimize costs, some protocol chips also integrated a buck or boost in it.

This paper introduces a protocol chip (This chip also integrated a buck) test solution for automotive application and developed based on ETS-88. In this solution, we will introduce how to develop 4site’s protocol chip test on ETS-88. We also introduce how to design the DIB, how can we get a better test time. Below are some highlights for this solution: 1. There are some high-resolution ADC in this chip and one LSB is less than 1mV, we can test it directly in ETS88 and we can also verify it with SPU pedestal mode which accuracy is close to a 6-bit voltage meter in lab. 2.We can also get a fast test time with advanced ETS test method such as DSP tool. 3.We can get a very high PTE for 4 site testing with MST shell. 4.Design the DIB to avoid noise and interference.