Semiconductor manufacturers seek adaptive test strategies to optimize their test efficiency. To provide adaptive test solutions, test engineers need to link data from the test cell to custom AI/Machine Learning models that can provide a dynamic response to alter the test program execution. Using Teradyne’s recently introduced Analytic Management Platform (AMP), this presentation will demonstrate how test engineers can readily create portable customizable solutions that leverage their AI model’s knowledge to alter IG-XL test program execution without requiring persistent job changes. We will compare two categories of adaptive changes: changes that can be requested asynchronously, such as disabling tests, and changes that require being done synchronously immediately after a touchdown, such as a rebin operation. A walk-through of a customized rebin solution for IG-XL using the UltraEdge will be covered during the presentation. This presentation will highlight how AMP and its SDK can easily support integration with a wide range of AI and Machine Learning models, enhancing the test engineer’s capability to harness the power of their test data to make real-time decisions that can improve overall test outcomes.