Most low cost MCUs have embedded 10 or 12-bit ADCs. Testing those ADCs usually requires precise analog instruments to drive a ramp in sync with a pattern. Especially with higher site counts at wafer test, the need for many of those precise instruments can lead to an increased cost of test. The UltraFLEXplus UP2200 digital instrument has a PMU per pin, and the accuracy and linearity is appropriate for testing 10 and 12-bit ADCs. Having a PMU behind each pin allows testing multiple sites or ADC inputs in parallel to reduce test time. In addition, the PMU can also be used to drive ramps for threshold tests or trimming. Up to now, synchronizing the PMU with the pattern required using pattern CPU flags to repeatedly jump back and forth between the pattern and an interpose function. This use model has unnecessary complexity and overhead due to the hand shaking between the pattern and interpose function. A new PMU feature has been introduced to support pattern synchronous ramp generation, without the need for interpose functions. This simplifies test development and makes optimal use of the PACE architecture and background processing of the UltraFLEXplus. This paper will describe how to use this new feature and its capabilities on synchronizing the signal with a pattern module. It will then demonstrate a proof of the solution on a real device in production and compare it to a solution using more precise instruments.