In semiconductor testing, accurate and efficient logging of results is crucial. IG-XL offers integrated mechanisms to log results into Standard Test Data Format (STDF) files, ASCII datalogs, or display them in an output window for immediate verification. While these built-in options cater to many standard needs, certain applications require specialized logging solutions tailored to specific customer requirements. To address these needs, IG-XL supports the attachment of custom data consumers.

This presentation will delve into the general interface provided by IG-XL for custom data consumers and introduce ScanFalcon, an existing custom data consumer uniquely designed for ScanFailProcessing. ScanFalcon enhances the flexibility of data logging by allowing users to define the output log file using a format definition file and adjust settings through a configuration file. We will explore the key features and benefits of using ScanFalcon, including its adaptability to various logging requirements and its ability to streamline the data verification process. Attendees will gain insights into the implementation and configuration of ScanFalcon, demonstrating how it can be utilized to optimize semiconductor testing workflows.