Digital Test Instrument

High Pin Count TTL/LVTTL/LVDS with FPGA Configurability and VPC Funnel

Best choice when current or future requirements include:

  • High pin count TTL/LVTTL capability
  • High throughput IEEE 1149.1 test and memory programming
  • Conventional stored pattern capability
  • FPGA configurability to address a variety of low-level bus specifications
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eDigital 6020a LVTTL
  • Integrated Instrument and Virginia Panel Funnel Interface
    • Single-piece instrument and funnel assembly with QuadraPaddle interface module
    • Supports both i2 MX cables and G20 ITAs
    • 3.3V LVTTL is TTL-Tolerant and compatible
    • Supports up to 64 LVTTL I/O pins, or 32 LVDS differential pairs
  • Broad IEEE 1149.1 Boundary Scan support
    • Supported by the runtime software from the major third-party vendors
    • Conventional interconnect tests through large-capacity Flash programming
    • Multiple Test Access Ports and large pin count parallel I/O
    • Serial Vector Format (SVF) runtime capability (HSSub App included in TriFlex software)
  • Teradyne eDigital HSSub App provides conventional stored pattern (truth table) testing (included in HSSub TriFlex software)
  • Flexible low-level HSSub Tier 1 I/O Bus Processing
    • Reconfigurable HSSub Tier 1 (I/O Bus Processing) of the HSSub Three Tier Architecture implemented by a large Test Defined FPGA and local memory
    • Configured in seconds by HSSub Apps supported by Teradyne, end-users, and third-party developers
    • HSSub App development, if required, is simplified by FPGA template code based on standard design patterns
    • HSSub TriFlex Infrastructure Software interfaces provide access to the hardware from Windows Tier 3 or HSSub Tier 2 instruments