Magnum 7H
Advanced High Bandwidth Memory Test Platform to Support Next-generation AI Applications
With the proliferation of AI, high–bandwidth memory (HBM) has become an integral part of AI processors due to its ability to handle the massive data processing and complex computations required by modern AI models. Teradyne’s Magnum 7H platform delivers industry-leading speed and parallel test efficiency for HBM. With advanced memory and logic testing capabilities, these systems support critical test stages of the HBM manufacturing process—from base die wafer test to pre-singulated HBM test to post-singulated HBM test—including memory core testing and speed validation.
Advantages
High Performance
Supports data rates up to 4.5 Gbps with high-speed tester interface units (TIUs), enabling speed testing of current HBM3/3E and next-generation HBM4/4E devices.
High Parallelism
Configurable for up to 9,216 digital pins and 2,560 power pins to maximize parallel throughput in mass production environments.
Proven P52 Probe TIU
Leverages the field-tested Teradyne P52 probe TIU, currently deployed in hundreds of Magnum production systems worldwide.
Comprehensive Logic Testing
- Supports at-speed memory testing with a flexible algorithmic pattern generator (APG).
- Supports at-speed logic testing and deep Logic Vector Memory (LVM) option.
- Features Fail List Streaming (FLSTM) for at-speed error capture for both memory and logic testing.
Application Coverage
- HBM base die wafer test
- Pre-singulated HBM (stacked dies on base wafer) test
- Post-Singulated HBM (stacked dies) test
Configurations
Magnum 7H SSV
- Configurable up to 9,216 digital pins and 2,560 power pins
- Power pin with 1.2A or 2A options
- Speed options up to 4.5Gbps
- Logic Vector Memory (LVM) options
System Options
Probe TIUs
- The Magnum 7H leverages Teradyne’s P52 wafer sort interface used across multiple Teradyne platforms.
Calibration Kit
- Includes a dedicated probe interface check and DxCal board, designed for Teradyne’s P52 TIUs. Once calibrated, the system matches the reference tables to the customer-specific probe cards mounted on the TIU.
Software
Magnum 7H utilizes interoperable Teradyne test development and debug tools, enabling seamless collaboration across Magnum platforms. Test programs are developed once for a site testing one or more devices, then automatically cloned to all applicable sites on the tester, streamlining the entire process. The debug suite is site-aware, making it easy to isolate issues at the device level and ensuring a smooth transition from new product introduction to high-volume manufacturing.