Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
The UltraWaveMX44 and UltraWaveMX20-D16 instruments extend the UltraWave24 capability for full test coverage of WiFi, LTE, Ultra-wideband and 5G standards. Existing UltraWave24 customers can upgrade their systems with a single slot instrument that does not require reconfiguration of the test system. They can continue to use existing Device Interface Boards (DIBs) and production interface docking compatibility for their existing applications.
The new UltraWaveMX44 instrument enables faster time to market and higher product yields for semiconductor devices used in emerging mmWave applications.
By extending the UltraWave24 capability up to 44GHz with the UltraWaveMX44, UltraFLEX customers can test the 5G-NR standard while maintaining full DIB and docking compatibility.
The award-winning IG-XL test software environment enables simple programming for fast test program development. Interactive debug displays integrated with the instrument hardware create an intuitive software system that minimizes training and speeds time to market.
Teradyne’s UltraWaveMX44 features native 5G-NR modulation and demodulation test coverage with the integrated ESA toolkit using industry-standard waveform algorithms for waveform modulation and demodulation to simplify bench-to-ATE correlation.
UltraWaveMX44 supports characterization and production device testing for probe, package, module and over-the-air applications. NIST traceable integrated calibration circuitry delivers superior instrument performance, repeatable results and tester-to-tester correlation. In addition, there is full test coverage for 5G multi-antenna beamforming devices.
Highest Performance Instrument
A patented active thermal control within the instrument guarantees temperature stability to ensure that high-performance specifications are meet in the engineering and production environments. The UltraWaveMX44 features an integrated power detector which provides specification traceability. The instrument’s frequency range covers 6GHz to 44GHz. The instrument has 800MHz bandwidth and can acheive greater then 2GHz bandwidth through its high performance path. It supports RF and IF interfaces for both 5G IF transceiver and 5G RF Beamformer device coverage. There is a dedicated low phase noise DUT reference clock operating from 100MHz to 6GHz to supply a precision reference clock for devices with integrated PLLs.
Simplified Device Interface Board (DIB) Design
The UltraWaveMX44 is a single slot instrument in the UltraFLEX system and acts as an extension to the UltraWave24 RF instrument. It provides dedicated mmWave frequency blind-mate coaxial DIB connections which are designed to withstand the challenges of a production environment while providing the performance to source and measure high quality 44GHz test waveforms to the device.
The UltraWaveMX44 seamlessly integrates into your manufacturing flow by maintaining fully legacy compatibility with existing applications. Existing RF DIBs can continue to be used with a system configured with the UltraWaveMX44 instrument without any system reconfigurations.
There are 32 mmWave ports available on the UltraWaveMX44 making DIB design significantly easier because sensitive signal switching is not required on the DIB. And, the system can be configured with up to 128 mmWave ports which may be required when scaling for high site count multisite testing.
In addition to the UltraWaveMX44, there is a lower frequency band version called the UltraWaveMX20-D16. This instrument is also an extension to the UltraWave24 to provide additional test coverage up to 20GHz. This frequency band can cover devices that have WiFi-6, Cellular 5G, Ultra-wideband, and 5G-NR IF interfaces.
The new UltraWaveMX20-D16 instrumentenables faster time to market and high product yields through its ease of use and industry leading performance.
Each UltraWaveMX20-D16 provides 16 mmWave ports in the test system with the ability to configure up to 64 mmWave ports for high site count testing.
UltraWaveMX44 and UltraWaveMX20
By offering both the UltraWaveMX44 and UltraWaveMX20-D16 instruments, semiconductor manufacturers can configure their test systems with the most cost-effective solution to test current and future generations of mmWave devices.
Preserving DIB compatibility and production test cell interface compatibility, the UltraWave MX-family seamlessly integrates into the manufacturing environment. The robust blind mate coaxial signal interface and the patented temperature-controlled electronics deliver industry leading performance with extremely high reliability.
Based on IG-XL, the number one customer voted software environment, test engineers can get new device test programs developed quickly and released into production meeting new market opportunities.