The semiconductor industry is facing a continuous increasing complexity in the integrated circuit design which has led to more challenges in testing. One of the major challenges is the increase in parallel and scan patterns size due to new manufacturing processes and device testing requirements. The improved capabilities and performance for UltraFLEXplus digital instruments UltraPin2200 and UltraPin2200+ addresses these challenges by providing larger and pooled vector memory shared across channels, larger scan capabilities, and more flexible memory allocation to increase pattern depth. With careful consideration in channel selection the vector memory capabilities can be further utilized beyond the spec and will demonstrate how the memory is consumed by scan and functional patterns. The objective of this paper is to explore the ways to maximize the vector memory utilization with the UltraPin2200 vector memory architecture and decipher the LicenseRequirements file and allow a user to calculate/predict the appropriate memory license for the application. The techniques discussed include channel assignment considerations during pre-design DIB stage, implementation of site copy feature, and functional vector compression which have been proven to improve memory consumption in several projects with large patterns.