Magnum VUy for NAND Protocol Test Enhancement

Flexible

Magnum VU is a flexible, superset test platform that uniquely covers all NAND test, including protocol test of next generation mobile and automotive devices UFS4.1 and PCIe Gen 5, and also the previous generation of mobile devices UFS3.1, PCI Gen 4. It can also test e.MMC, as well as ONFI, Toggle, and raw NAND for solid state drives (SSD). This flexibility provides the lowest risk investment for all next generation NAND test capacity and engineering.

Scalable

Magnum VU is a scalable test platform built for longevity. In order to leverage our customer’s investments in our test platform, Teradyne designed the Universal Protocol Board to be easily upgradable. The original UPB has now been followed by UPBx and UPBy, and when the next technology comes UPBz.

Highest Performance and Highest Throughput

Magnum VUy is a high performance, high throughput test platform. Using Teradyne technology to miniaturize the UPBy instrument, Teradyne radically changed the test paradigm, completely eliminating the traditional cabling between the test instrument and device under test (DUT), and directly docking the UPBy to the socket boards. This architecture, called near DUT test (NDT), dramatically shortens the signal path, increases performance, reduces latency, and most closely emulates the real system environment.