Siemens has introduced Tessent™ Streaming Scan Network (SSN) IP that can be included in devices to help with reducing scan test data volume and to allow efficient testing of multiple cores in parallel. SSN support two basic modes – “tester-compare” and “on-chip compare”. This paper will review the basics of the SSN Tester Compare operation and then review recent updates made to IG-XL on the UltraFlexPlus to assist the user with implementing efficient test instances for devices utilizing SSN Tester Compare. Topics covered will include how to encapsulate data mapping information extracted from the EDA simulation output into binary pattern files, review new data objects to efficiently identify failing cores after an SSN pattern burst, and review new language to allow the user to easily apply core masking without modification of the SSN pattern files.