As AI continues to drive unprecedented power demands across data centers, the need for rigorous semiconductor testing has never been more critical. Our new video series features perspectives from Teradyne’s leaders on the trends shaping AI infrastructure and the role test plays in keeping pace with this growth. In our first episode, Dominic Viens, Vice President and General Manager of Power Test, discusses the challenges of power semiconductor testing and how Teradyne’s ETS platform is enabling the efficiency, reliability, and scalability that next-generation data centers require. Contact us to learn more.
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Dominic Viens is Vice President and General Manager of the Power Test Division at Teradyne, where he leads global strategy and operations for power semiconductor test solutions. With over 25 years of experience across product management, sales, and engineering, Dominic has held senior roles at both Teradyne and MathWorks. He has successfully launched high-growth product lines, driven complex design-ins, and led global teams across Asia, Europe, and North America. Dominic holds a degree in Electrical Engineering from McGill University. He also holds multiple patents in semiconductor test innovation.