The semiconductor industry is transforming, driven by advancements in AI, advanced packaging, heterogeneous integration, and edge computing. As semiconductor design and manufacturing grow in complexity to meet these needs, flexible test strategies emerge as the linchpin for balancing yield, cost, and quality.
The automated test equipment (ATE) sector plays a critical role in not only ensuring these complex, high-performance chips meet stringent quality standards but also preparing the industry to navigate a steady stream of future challenges.
Jeorge Hurtate’s latest article in EE Times explains how flexible strategies powered by AI and data insights are helping the industry address emerging technologies including 5G, quantum devices, and photonic integration.
Read the full article, Flexible Test Strategies Keeping Pace with Semiconductor Evolution, published by EE Times
Dr. Jeorge S. Hurtarte is currently Senior Director and Principal Marketing Strategist in the Semiconductor Compute Test Division at Teradyne. Jeorge has held various technical, management and executive positions at Teradyne, Lam Research, LitePoint, TranSwitch, and Rockwell Semiconductors. Jeorge is in the Advisory Board of SEMI of North America and serves as co-chair of the IEEE Heterogeneous Integration Roadmap (HIR) Test Chapter. Jeorge holds a PhD in Electrical Engineering, and three master’s degrees (MBA, Computer Science, and Telecommunications). He is also visiting professor at the University of California, Santa Cruz and at the University of Phoenix. He is co-author of the book Understanding Fabless IC Technology.