eDigital-Series™ Digital Test Instrumentation
PXIe digital instrument supporting parallel digital testing for LVDS technologies.
Defense and aerospace boxes and board designs frequently use low voltage TTL (LVTTL) and/or low voltage differential signaling (LVDS) technologies and often require boundary scan and parallel I/O flash programming test capability. eDigital-Series instruments provide flexible, parallel digital functional test for units under test (UUTs) employing logic voltages between 1.8V to 3.3V (5V TTL tolerant).
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
eDigital-Series instruments also capitalize on the boundary scan, parallel I/O, and flash programming capabilities, which are often included on these newer UUTs. Packaged in a compact PXIe form factor, eDigital-Series instruments may be used as a standalone instrument or configured as part of an integrated HSSub system.
Superior LVTTL and LVDS digital test performance.
Its 1.8V to 3.3V (5V TTL tolerant) digital channels feature an 8M pattern depth and results memory at up to 25 MHz data rates across 32 differential or single-ended channels.
Device programming via boundary scan and third-party boundary scan support.
Supports JTAG, Asset, Corelis, and Acculogic boundary scan tools.
eDigital software driver.
Provides full control of per-pin timing, data format, and deskew across 64 static channels, or 32 dynamic and 32 static channels, or across 32 differential channels.
PXIe form factor.
Compact form factor maximizes performance density while reducing test system footprint.
Reliability and survivability.
High-density packaging and strict quality control including shock and vibration testing ensure low mean time between failure (MTBF) in the most rugged shipboard and mobile environments.
Available support services include 24-hour repair-and-return of defective parts, hotline telephone support, comprehensive training and documentation, and in-field calibration verification.
The eDigital-Series instrument family features a host of critical test capabilities that cover a wide range of applications.
eDigital-Series applications include:
- Parallel digital test
- Single-ended and differential digital test
- Conventional, parallel I/O and flash programming via boundary scan I2C +SPI and PCI via HSSub App
eDigital-Series is available as a standalone instrument or as a member of the HSSub instrumentation family:
Configuration choices include:
- HSSub-6020 with funnel
Additional Capabilities and Accessories
- Optional interface adapters and cables
- Optional extended warranty/advanced replacement service