The ETS-200T discrete test platform is built on proven ETS technology and provides true index-parallel testing specifically for turret and rotary handlers. These test systems maximize throughput with pattern-based test techniques based on Eagle SmartPin™ technology coupled with the use of dynamic Cbits for enhanced user control. The ETS-200T provides a complete test solution from wafer sort to final test for MOSFETs, including integrated control and datalogging for UIL, dVSD, Qg and LCR meter.
Prewritten subtests help users avoid programming limitations commonly found in many discrete test systems.
Integrated with rotary and turret handlers for a complete final test discrete solution.
Integrated help file provides a detailed description of the test along with additional block diagrams and tool tips for optimizing test routines.
The ETS-200T test systems provide solutions with average site counts equal to or in excess of 16, with coverage of both DC and AC testing parameters. The robust software package combines pre-programmed routines for standardized tests with flexible programming tools for easy creation of customized tests. Completely integrated AC testing, including UIL Inductive Switching, Cg, Rg and Qg makes the 200T the ideal solution for both wafer and packaged device testing of discrete devices.
DVI: digital V/I supports 16-bit voltage measurements up to +/-20 V with 0.61 mV resolution in 50us.
HPU-100: single channel V/I with 10 current ranges operating up to +/-100 V
SPU Family (100, 112, 500): suite of V/I’s capable of addressing a wide range of test requirements ranging from 100V / 2A to 500V / 50mA with fully AWG and digitizing capabilities per channel
Raptor includes a graphical user interface that allows fast programming and characterization with no language-based programming required. This innovative user interface allows users to directly input test conditions for a particular test and place the test in a user defined test flow. The pre-programmed test routines provide simple and easy to use methods for test programming that help users avoid programming mistakes and overcome limitations commonly found in many discrete test systems. The Raptor FT software suite increases test development productivity.
As the leading provider of complete Test Cell Solutions and services, we at Teradyne leverage our expertise, experience, and technology leadership to help our customers achieve the highest yield and the highest throughput in production with the fastest time to market. We partner with you in your journey from design to production to provide standard and customized test cell products and services.