UltraFLEX mmWave Instruments

The UltraWaveMX44 and UltraWaveMX20 instruments enables faster time to market and higher product yields for semiconductor devices used in emerging mmWave applications. The MX44 and MX20 extend the UltraWave24 capability for full test coverage of IoT, WiFi, LTE, Ultra Wideband, and 5G standards while maintaining full DIB and docking compatibility.

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  • UltraWave-MX44

    An UltraFLEX Test Solution for the New 5G-NR Millimeter Wave Market

    The new UltraWave-MX44 instrument enables faster time to market and higher product yields for semiconductor devices used in emerging 5G mmWave applications. 

    • Extends the UltraWave24 capability up to 44GHz to address the 5G-NR standard while maintaining full DIB and docking compatibility
    • Industry-leading programming software and debug tools for fast time to market
    • Supports characterization and production device testing for probe, package, over-the-air and module applications
    • Patented active thermal control and NIST traceable integrated calibration circuitry delivers superior instrument performance and tester-to-tester repeatability
    • Full test coverage for 5G multi-antenna beamforming devices

    Additonal features include:

    Highest Performance Modules

    • Guaranteed temperature stability utilizing integrated thermal monitoring
    • Integrated power detectors for specification traceability over longer calibration windows
    • Frequency coverage from 6GHz to 44GHz
    • Supports both RF & IF interfaces for both transceiver and FEM device coverage
    • 800 MHz channel bandwidth with >2GHz high performance path
    • Dedicated low phase noise DUT reference clock operating from 100MHz to 6GHz

    Simplified DIB Design

    • New 5G mmWave DIBs fully compatible with existing manufacturing test cells
    • 32 ports per instrument for multi-antenna devices
      • System configurable to 128 total mmWave ports
    • Integrated signal muxing reduces DIB circuitry when scaling to mulitsite
    • Production proven blind-mate coaxial signal delivery

    Fastest Program Development Environment

    • Simple programming using award-winning IG-XL test software
    • Integrated, interactive debug displays
    • Native 5G-NR modulation and demodulation test coverage with integrated ESA Toolkit using industry-standard bench algorithims for simplified bench-to-ATE correlation
  • UltraWave-MX20

    An UltraFLEX Test Solution Expanding Test Coverage to 20 GHz for 6-GHz Band WiFi and Cellular, Ultra Wideband, and 5G IF Devices

    The new UltraWave-MX20 D16 instrument enables faster time to market and higher product yields for semiconductor devices used in emerging applications operating up to 20 GHz. 

    • Extends the UltraWave24 capability up to 20 GHz for full test coverage of WiFi-6, 4G/5G Cellular, Ultra Wideband and 5G-NR IF devices
    • Maintains full DIB, docking, and program compatibility with current applications with no system reconfiguration
    • Industry-leading programming software and debug tools for fast time to market
    • Supports characterization and production device testing for probe, package and module applications
    • Patented active thermal control and NIST traceable integrated calibration circuitry delivers superior instrument performance and tester-to-tester repeatability

    Additional features include:

    Highest Performance Modules

    • Guaranteed temperature stability utilizing integrated thermal monitoring
    • Integrated power detectors for specification traceability over longer calibration windows
    • Frequency coverage from 6 GHz to 20 GHz
    • 800 MHz channel bandwidth with >2GHz high performance path
    • Dedicated low phase noise DUT reference clock operating from 100MHz to 6GHz

    Simplified DIB Design

    • New DIBs fully compatible with existing manufacturing test cells
    • 16 ports per instrument for high pin count devices
      • System configurable to 64 total mmWave ports
    • Integrated signal muxing reduces DIB circuitry when scaling to multisite
    • Production proven blind-mate coaxial signal delivery

    Fastest Program Development Environment

    • Simple programming using award-winning IG-XL test software
    • Integrated, interactive debug displays
    • Native WLAN, Cellular, and UWB modulation and demodulation test coverage with integrated ESA Toolkit using industry-standard bench algorithms for simplified bench-to-ATE correlation

Whitepaper - 5G Device Test Strategies 

As 5G network infrastructure deployments gain momentum using newly allocated spectrum and 5G devices begin its early production phase in 2019, several wireless test insertion scenarios and test strategies are being evaluated for the next phase of high volume production.  For 5G millimeter wave devices, over-the-air radiated tests present a new set of test challenges as compared to sub-6 GHz devices. Teradyne test solutions are at the forefront of the 5G Era. 

Complete the form below to download a presentation, providing an overview of the possible test insertion scenarios for 5G devices, their intended fault coverage objectives and possible test strategies to address such from the lab to mass production.