Low Cost, High Efficiency Parallel Test
The J750 is the foundation for one of the most successful test platforms in ATE history, with more than 3,000 systems installed worldwide and widely available at subcons. Now, Teradyne takes that capability to a new level and continues to redefine the economics of test with the J750Ex.
The J750Ex provides highly economical, parallel test solutions for high-performance microcontrollers, consumer SoC devices, and digital wafer sort applications.
High parallel test configuration with 50% higher throughput
99% parallel test efficiency
All J750 systems are DIB compatible, and the tens of thousands of J750 test programs can be run on the J750Ex. The J750Ex gives you the test throughput, coverage, and performance to handle the next generation of high-volume, low cost devices.
System features include:
• 200 MHz /400 Mbps digital