AI is redefining the infrastructure that powers it, and nowhere is that more true than at the compute layer. As server architectures and AI accelerators grow more complex, testing has to keep pace on both the hardware and software fronts. In this episode, Roy Chorev, Vice President and General Manager of the Compute Test Division, discusses the demands next-generation AI places on test, and how Teradyne’s platforms and software tools work together to deliver the speed, flexibility, and quality customers need. Contact us to learn more.
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Roy Chorev is the Vice President and General Manager of the Compute Test Division at Teradyne where he is responsible for product development for Teradyne’s semiconductor test products. With more than twenty years of experience in the automated test equipment industry, he has held a number of roles in software development, systems engineering and product marketing at Teradyne. Roy holds a Bachelor of Arts in computer science from McGill University and Master of Business Administration from Babson College.