Versatile VXI Analog Instruments

Standards-based test instrument combines legacy functionality with advanced parallel test capability.

Ai-762—the newest member of the Ai-760 Series in the Core Systems Instruments (CSi) family—is a standards-based integrated test and measurement tool that consolidates traditional instruments into a single-slot VXI package.

It enhances ATE analog and mixed signal test capabilities, eliminates multiple discrete instruments, and reduces physical tester footprint.

The Ai-762 provides extensive analog functionality, including digital multimeter (DMM), digital sampling oscilloscope (DSO), and multi-channel tester-per-pin capability (waveform generator, digitizer, timer/counter) enabling parallel stimulus/measurement of the Unit Under Test (UUT).

These features make it the ideal analog stimulus/measurement instrument for ATE system integrators, who need to leverage existing test program sets (TPS) while capturing the benefits of advanced operational test. These features result in superior test performance, faster throughput, and lower overall cost of test.

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Complete Analog Subsystem with Multi-Function Analog (MFA) channels.
Increases ATE system capabilities while lowering operating and TPS development costs.

Physical consolidation of traditional analog instruments.
Increased functional test density with decreased test system footprint.

Parallel Test capability.
Test multiple ports simultaneously to improve overall quality of test by identifying problems caused by faulty UUT channel interactions.

Tester-per-pin channels.
All 8 (or 16) MFA channels operate independently and simultaneously to speed throughput and accommodate complex test protocols.

Operational test capability.
Ability to emulate UUT operating conditions expands fault capture envelope during both production and field testing.

Worldwide support.
Available support services include 24-hour repair-and-return of defective parts, hotline telephone support and comprehensive training and documentation.


The Ai-762 instrument features a host of critical test capabilities that cover a wide range of applications.

  • Consolidate discrete multiple-slot instrumentation into a single slot VXI instrument on existing ATE systems for more efficient WRA/LRU testing in factory or depot.
  • Design and implement new ATE systems with simultaneous stimulus and measurement to allow true parallel operational test.
  • Accelerate test throughput with parallel testing of multiple UUT ports.


The Ai-762 is available in a variety of configurations:

8-channel MFA

16-channel MFA DMM