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System Level Test
A Real-world Use Case for the Industry’s First Fully Automated System Level Test Platform with Integrated RF Test Instrumentation
System Level Test (SLT) is testing a device under test (DUT) in an environment that closely matches its final use. The growing complexity of SOCs and SIPs, combined with increasingly st...
Wireless
The Future of Wireless Test is Over the Air
Emerging Need for Over-the-Air Test Methods The deployment of mmWave technology is synonymous with 5G rollout and the initial results for faster links are amazing. For example, using a ...
Wireless
The Great Migration to 5G is Underway
A Quick Wireless History – How We Got to 5G Every decade brings with it a plethora of technology changes, and the cumulative effects of 50+ years of changes in wireless technologies a...
Test Strategies
Minimizing Execution Risk in Test Solution Development
Test development projects are a mix of engineering disciplines with a complex and interdependent ecosystem. The ability to assess risks and their impact on the entire project can be the...
Compute
Test Strategies
Semiconductor Test in the Gate All Around Era: SemiCon Korea 2022
The past two years have witnessed unprecedented growth in the semiconductor industry, driven by advances in artificial intelligence, natural language processing, automated vehicles, and...
System Level Test
System Level Test – A Primer: White Paper
As semiconductor geometries become smaller and greater complexity is pushed into chips or packages, System Level Test (SLT) is becoming essential. Peter Reichert, System Architect for T...
Compute
Test Strategies
High-Speed Scan Testing with Streaming Scan Network & IEEE 1149.10: ITC 2021
Advanced processes are driving rapid data growth from testing, requiring new approaches to testing at higher speeds. Ed Seng, Product Marketing Manager at Teradyne, presents an overview...
Compute
Test Strategies
Detecting Spatial Blotches in Image Sensor Devices: SemiCon West 2021
One of the most common defects in image sensor devices is spatial blotches. The appearance of blotches in image sensors is a regular occurrence, and may be generated by internal moving ...
Test Strategies
Wireless
From 5G mmWave to 6G THz: RF Test Challenges: SemiCon West 2021
As each “G” in mobile networks generations takes about eight years to follow the previous one, we’re only about five years away from facing new 6G THz test challenges. And given t...
Compute
Semiconductor Test – Staying Ahead of NanoDevices: SemiCon West 2021
In the semiconductor fabrication process, engineers continue to innovate, enabling smaller transistors and higher density circuits. The transition to FinFETs allowed 7nm and 5nm process...