In-Circuit Test (ICT) Systems

 High Quality & Reliable ICT


Teradyne’s ICT systems provide electronics manufacturers with reliable structural defect detection for all PCBA technologies. Teradyne's latest ICT technologies provide excellent fault coverage and high throughput to ensure fast and defect-free manufacturing that lowers total cost of test.

 Learn more about TestStation ICT Systems

ICT + Functional Test

Extend TestStation Functionality

Teradyne's agile ICT systems allow manufacturers to perform focused functional test at the same stage in the manufacturing process. A single TestStation configured with PXI or Multi-Function Application Boards provides ICT and Functional Tests on the same system - without expanding tester footprint.  TestStation-PXI-Functional-Test

Benefits of expanding functional test:

  • Lower capital costs
  • Quicker defect detection
  • Faster cycle time/beat rate
  • Reduced test stages / operators
  • Greater fault coverage

Download the Case Study: Benefits of Combining ICT & Functional Test"

Multi-Site In-Circuit Test

TestStation Multi-SiteTeradyne's TestStation Multi-Site in-circuit test systems provide high-volume electronics manufacturers with reliable high-quality test for the latest PCB technologies. Achieve greater productivity and lower cost-of-test with the following multiple-test-site configurations:

Inline & Automation

Teradyne HandlerWith Teradyne, high-volume electronics manufacturers can conduct true parallel test, achieving 2-4 times greater productivity and 40%-50% lower cost-of-test. We offer the following automation solutions for high-speed in-circuit testing within the TestStation platform:

Test Software

teradyne-softwareTeradyne-SoftwareTeradyne offers powerful software tools and solutions that enable electronics manufacturers to optimize test across all stages in the manufacturing process. The following tools are available for use on TestStation and/or Spectrum test systems: