Quickly Detect More Faults
TestStation in-circuit test capabilities (ICT) allow manufacturers to detect more faults quickly. Perform "non-contact" electrical testing for limited access technologies. Reduce test stages, boarding handling and operator costs with TestStation systems.
ICT + Functional Test
TestStation systems provide focused functional test (FCT) at the same stage as in-circuit test (ICT)
- Use a single test system for both ICT + FCT
- Reduce test stages
- Reduce board handling and operator costs
Learn how to combine ICT & FCT
Boundary Scan Solutions
Choose from our native or many available partner options to test limited access nets. Achieve greater fault coverage with integrated solutions directly within TestStation. Reduce equipment and support costs with Teradyne's flexible boundary scan solutions.
Learn how to combine ICT and Boundary Scan
Open Pin Detection
Expand test coverage with capacitive-based vectorless test Framescan techniques to detect open pins on devices and connectors. No test vectors are required and our vectorless test technologies are designed for fast development.
Learn how to expand test coverage with Framescan Technologies
TestStation allows the programming of logic devices and Flash memories in a single stage, saving valuable time and cost.
Learn how TestStation reduces complexity of device programming